Biology 314 - Topics in Advanced Microscopy Techniques for Research: Scanning Electron Microscopy

Instrument specific topics course designed and highly recommended for research students (special studies, honors, SURF, etc.) requiring future access to microscope equipment in the Center for Microscopy and Imaging (CMI). Students will discuss the need of the Microscope system of their choice for their research project by preparing and presenting short presentations and a poster (or alternative format). Emphasized are group and/or individual demonstration sessions required to learn about the principles and operating parameters of a microscope system (see topics). Digital Imaging and Image Analysis Techniques will be discussed. Evaluation will be through engagement in assigned activities. 400 level work cannot overlap with this course work. Instructor permission only. Enrollment limited to 6. S/U only: The SEM is used to examine small surface features of both biological and nonbiological materials. By using a beam of electrons, a resolution of 3-10nm can be achieved. Besides high-resolution surface topography, compositional information about a sample can be collected when the system is equipped with an X-ray detector. Mechanical and optical components will be reviewed and operational parameters improving image quality covered. Instruction includes lectures, demonstrations and discussions and substitutes part of CMI training towards independent microscope use.

Instructor Permission.